Tag Archive
Single-Step Doping Process Developed for Graphene (Newswise)
A simple one-step process that produces both n-type and p-type doping of large-area graphene surfaces could facilitate use of the promising material for future electronic devices. The doping technique can also be used to increase conductivity in graphene nanoribbons used for interconnects. (read here…) Related items Carbon semiconductors clear CMOS hurdle (EETimes) High-tech origami: Water droplets direct self-assembly... »
Improving Semiconductor Technology (PhysOrg)
(PhysOrg.com) — The ultimate goal of engineering professor Brian Willis’ research is to improve the functionality of future electronic devices. (read the story…) Related items Researchers develop molecular ‘LEGO kit’ to create nano-cubes (PhysOrg) When It Comes to Drug Delivery, Size Matters (PhysOrg) A Fee That Can Actually Make You Money? (PhysOrg) Nanomaterials in Ecosystems: Should we worry? [A Blog... »
Watching crystals grow provides clues to making smoother, defect-free thin films (Science Daily)
To make thin films for semiconductors in electronic devices, layers of atoms must be grown in neat, crystalline sheets. But while some materials grow smooth crystals, others tend to develop bumps and defects — a serious problem for thin-film manufacturing. Physicists shed new light on how atoms arrange themselves into thin films. (read on…) Related items Spasers... »
Defects in carbon nanotubes could lead to improved charging for cell phones (New Kerala)
Washington, November 20 : Scientists have discovered that defects in carbon nanotubes could lead to supercapacitors that could possibly be used for improving charge and energy storage systems in portable electronic devices such as cell phones. (read here…) Related items Carbon nanotubes can affect lung lining (MalaysiaNews.net) Advance in ‘nano-agriculture’: Tiny stuff has huge effect on plant growth... »
Get The Job Done With Nikon Metrology’s XT V 130, The X-Ray Inspection Workhorse For Electronics Quality Assurance (MetrologyWorld.com)
Nikon Metrology announces the compact yet versatile XT V 130 X-ray inspection system that efficiently traces failures inside complex electronic devices and multilayer circuit boards (read on…) Related items Buff Briefs | CU hosts nanotech symposium in April (Boulder Weekly) Light Twists Rigid Structures in Unexpected Nanotech Finding (Newswise) Governor Rendell: State Investments Lead Nanotech Company to Expand in... »
