New Nanocrystalline Diamond Probes Overcome Wear (redOrbit)

Wednesday, November 11, 2009 | News

Researchers at the McCormick School of Engineering and Applied Science at Northwestern University have developed, characterized, and modeled a new kind of probe used in atomic force microscopy (AFM), which images, measures, and manipulates matter at the nanoscale.Using diamond, researchers made a much more durable probe than the commercially available silicon nitride probes, which are typically …
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