Agilent Technologies And Stanford University To Explore New Class Of Nanoscale Devices (ElectronicsWeb)

Agilent Technologies Inc. announced it is collaborating with Stanford University in a research program designed to explore a new class of nanoscale devices using a combinations of the scanning probe microscope (SPM) and atomic layer deposition (ALD).
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Tags: Agilent, agilent technologies, agilent technologies inc, atomic layer deposition, Inc, nano, nanos, nanoscale devices, probe microscope, Research, Stanford, University

This entry was posted on Tuesday, November 3rd, 2009 at 1:54 pm and is filed under News.